Optical determination of interface roughness in multilayered semiconductor structures
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Applied Physics B: Lasers and Optics
سال: 1999
ISSN: 0946-2171,1432-0649
DOI: 10.1007/s003400050677